CHENG Na,SUN Zhi,ZHAO Jianwei.XRD Study on Cyanide-free Silver Plating Coating[J].Plating & Finishing,2018,(12):41-46.[doi:10.3969/j.issn.1001?3849.2018.12.010]
无氰镀银镀层的XRD研究
- Title:
- XRD Study on Cyanide-free Silver Plating Coating
- Keywords:
- XRD; non-cyanide silver plating; diffraction peak; crystal
- 分类号:
- O646
- 文献标志码:
- A
- 摘要:
- 针对清洁与安全生产的需求，近年来无氰镀银技术得到了深入研究。X射线衍射（XRD）技术广泛用于研究镀层的晶粒尺度和择优取向等信息，本文以ZHL-02新型碱性无氰镀银液为研究主体，利用XRD技术研究了温度、电流密度以及搅拌方式对银镀层结晶状态的影响。对衍射图样分析可知：在38.7 °、44.8 °、64.9 °和78.1 °附近出现衍射峰，分别对应银的（111）、（200）、（220）和（311）晶面。实验测得的衍射峰位均高于标准值，说明镀层致密。利用Scherrer公式拟合得到结晶颗粒在15~20 nm。
- Abstract:
- To meet the requirement of clean and safety production, the non-cyanide electroplating of silver has been intensively studied recently. X-ray diffraction (XRD) technology is widely used to study the crystal size and preferred orientation of the coating. In this paper, ZHL-02 new alkaline cyanide-free silver plating solution was taken as the main research, and the effects of temperature, current density and agitation mode on the crystallization state of the silver coatings were studied by XRD technology. The diffraction patterns analysis showed that the peaks at about 38.7 °, 44.8 °, 64.9 ° and 78.1 ° corresponding the silver facets of (111), (200), (220) and (311). The plating layer was more condensed which was demonstrated by the positive shift of the diffraction peaks. The crystal particles in 15~20 nm were obtained by the theoretical fitting with the Scherrer equation.
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备注/Memo
收稿日期： 2017-12-04
修回日期： 2018-02-17