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[1]齐国栋,宋 进,相君伦,等.印制电路焊盘表面修饰对焊点IMC生长状态影响的研究[J].电镀与精饰,2023,(10):1-10.[doi:10.3969/j.issn.1001-3849.2023.10.001]
 Qi Guodong,Song Jin,Xiang Junlun,et al.Study on the effect of surface modification of printed circuit pad on the growth state of soldering IMC[J].Plating & Finishing,2023,(10):1-10.[doi:10.3969/j.issn.1001-3849.2023.10.001]
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印制电路焊盘表面修饰对焊点IMC生长状态影响的研究

参考文献/References:



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[7] 祝大同 . 印制电路板制造技术的发展趋势 [J]. 印制电路信息 , 2003(12): 14-21.

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[20] Tian R Y, Hang C J, Tian Y H, et al. Growth behavior of intermetallic compounds and early formation of cracks in Sn-3Ag-0.5Cu solder joints under extreme temperature thermal shock[J]. Materials Science & Engineering: A-Structural Materials Properties Microstructure and Processing, 2018, 709: 125-133.

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[23] 李勋平 . BGA 结构 Cu(Ni)/Sn-3.0Ag-0.5Cu/Ni(Cu) 微焊点显微组织形成和演化及剪切断裂行为的尺寸效应 [D]. 广州 : 华南理工大学 , 2012.

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备注/Memo

收稿日期: 2023-03-08 修回日期: 2023-04-24 作者简介: 齐国栋( 1980 ―),男,本科,工程师, email : mykbc@vip.sina.com * 通信作者: 陈苑明, email : ymchen@uestc.edu.cn 基金项目: 珠海市科技项目( No. ZH22017001200002PWC )

更新日期/Last Update: 2023-10-07